I need to use the Atomic Force Microscopy Image Processing software WSxM 5.0 for this assignment. I have a series of instructions and tasks that need to be recorded and tracked (short reasoning on settings and value choices would benefit understanding as I will need to create image files using the software for this assignment, and I cannot use screenshots). There is also a list of restrictions/requirements. 1. Need to attach a Z-scale to images, altering the Z-scale to a clean number. Instructions on how to add one is fine 2. Cannot use the equalize tool to alter the image data to reduce the Z-scale 3. Profile lines must be indicated in the image, horizontal profile lines only 4. Do not flatten discarding regions 5. Use the optimum flatten process for best image quality and avoid lines. In this image: Flatten, profile, show the features present in the substrate surface and make a zoom of a cell anchorage. Change the position of the scale bar.