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(Solved): Among the crystalline forms shown below, is the most likely to suffer from electromigration. is re ...



Among the crystalline forms shown below,
is the most likely to suffer from electromigration.
is resistant to electromigration

Among the crystalline forms shown below, is the most likely to suffer from electromigration. is resistant to electromigration because its grain boundaries are to the flow of current through the wire. is resistant however it is unlikely to exist in a metal wire. No crystal lattice or grain boundaries Grain boundaries dominate Featuring both crystal lattice and grain boundaries Crystall lattice dominates Crystall lattice and lattice defects define characteristics


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Answer Amorphous is the most likely to suffer from elec
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